Carbon-electrode-based PSC devices are stressed under 1 Sun equivalent illumination in a stability setup, and different scan-speed dependent current-voltage (J-V) curves are measured during aging. The collected data is used to estimate several physical parameters that contain information about charge transport and recombination using Machine Learning (ML), which allows for in situ tracking of possible signs of degradation. These results are compared to what can be classically interpreted by analysing changes in J-V curves, and the evolution of the predicted parameters is studied. The predictions are then used to simulate a digital twin of the measured devices, and their physical implications and the differences between measurements and devices are discussed.

生成讲解博客的中文版本

生成AI智能校验的中文版本