Using Entangled Generalized Coherent States for Photonic Quantum Metrology

Quantum metrology aims at achieving enhanced performance in measuring unknown parameters by utilizing quantum resources. Thus, quantum metrology is an important application of quantum technologies. Photonic systems can implement these metrological tasks with simpler experimental techniques. We present a scheme for improved parameter estimation by introducing entangled generalized coherent states (EGCS) for photonic quantum metrology. These states show enhanced sensitivity beyond the classical and Heisenberg limits and prove to be advantageous as compared to the entangled coherent and NOON states. Further, we also propose a scheme for experimentally generating certain entangled generalized coherent states with current technology.