Bandgap fluctuations and robustness in two-dimensional hyperuniform dielectric materials

We numerically study the statistical fluctuations of photonic band gaps in ensembles of stealthy hyperuniform disordered patterns. We find that at low stealthiness, where correlations are weak, band gaps of different system realizations appear over a wide frequency range, are narrow, and generally do not overlap. Interestingly, above a critical value of stealthiness $\chi \gtrsim 0.35$, the bandgaps become large and overlap significantly from realization to realization, while a second gap appears. These observations extend our understanding of photonic bandgaps in disordered systems and provide information on the robustness of gaps in practical applications.