Magnetically enhanced thin film coarsening by a magnetic XPFC model allowing to decouple magnetic anisotropy and magnetostriction

External magnetic fields provide a macroscopic control mechanism to influence the microstructure of polycrystalline materials. We model the influence of strong magnetic fields on grain growth in thin films with a magnetic extended phase field crystal (XPFC) model. The magneto-structural effects are incorporated into the correlation function in reciprocal space. With this approach magnetic anisotropy, magnetostriction and mobility of grain boundary can be controlled and a variety of geometrical and topological properties consistent with experimental results can be determined.