A sample-position-autocorrection system with precision better than 1 \um~in angle-resolved photoemission experiments

We present the development of a high-precision sample-position-autocorrection system for photoemission experiments. A binocular vision method based on image pattern matching calculations was realized to track the sample position with an accuracy better than 1 \um, which was much smaller than the spot size of the incident laser. We illustrate the performance of the sample-position-autocorrection system with representative photoemission data on the topological insulator Bi${}_2$Se${}_3$ and an optimally-doped cuprate superconductor \Bi. Our method provides new possibilities for studying the temperature-dependent electronic structures in quantum materials by laser-based or spatially resolved photoemission systems with high precision and efficiency.