Characterization of ion-trap-induced ac-magnetic fields

The oscillating magnetic field produced by unbalanced currents in radio-frequency ion traps induces transition frequency shifts and sideband transitions that can be harmful to precision spectroscopy experiments. Here, we describe a methodology, based on two-photon spectroscopy, for determining both the strength and direction of rf-induced magnetic fields without modifying any DC magnetic bias field or changing any trap RF power. The technique is readily applicable to any trapped-ion experiment featuring narrow linewidth transitions.