Fractional ac Josephson effect as evidence of topological hinge states in a Dirac semimetal NiTe2

We experimentally investigate Josephson current between two 5~$\mu$m spaced superconducting indium leads, coupled to a NiTe${}_2$ single crystal flake, which is a type-II Dirac semimetal. Under microwave irradiation, we demonstrate a.c. Josephson effect at millikelvin temperatures as a number of Shapiro steps. In addition to the integer ($n=1,2,3,\mathrm{4...}$) steps, we observe fractional ones at half-integer values $n=1\mathrm{/}2,3\mathrm{/}2,5\mathrm{/}2$ and 7/2, which corresponds to $\pi$ periodicity of current-phase relationship. In contrast to previous investigations, we do not observe $4\pi$ periodicity (disappearance of the odd $n=1,3,\mathrm{5...}$ Shapiro steps), while the latter is usually considered as a fingerprint of helical surface states in Dirac semimetals and topological insulators. We argue, that our experiment confirms Josephson current through the topological hinge states in NiTe${}_2$: since one can exclude bulk supercurrent in 5~$\mu$m long Josephson junctions, interference of the hinge modes is responsible for the $\pi$ periodicity, while stable odd Shapiro steps reflect chiral character of the topological hinge states.