Interplay Between Single-Photon Ionization and the Auger Process in Argon Ion Formation

We explore the interactions between Argon and extreme ultraviolet (XUV) laser pulses across photon energies of 200 eV, 260 eV, and 315 eV, scrutinizing the influence of photon energy on Argon ion yields and unraveling the associated ionization pathways. Utilizing pulse durations of 10 fs and 30 fs, we spotlight a notable increase in Argon’s ionization propensity with escalating laser intensities, especially within the $5\times {10}^{14}{\text{W/cm}}^2$ to $1.2\times {10}^{16}{\text{W/cm}}^2$ range. While direct ionization predominated at 200 eV, the 260 eV and 315 eV spectra revealed complex interactions, prominently featuring the Auger process. A consistent overshadowing of odd-charged ions by even-charged Argon ions, particularly at 315 eV, paves the way for future research. The findings provide crucial insights into atomic interactions with intense light, establishing a groundwork for further exploration into similar atomic systems.