Effective medium theory for the electrical conductance of random resistor networks which mimic crack-template-based transparent conductive films

We studied random resistor networks produced with regular structure and random distribution of edge conductances. These networks are intended to mimic crack-template-based transparent conductive films as well some random networks produced using nano-imprinting technology. Applying an effective medium theory, we found out that the electrical conductance of such networks is $\approx 0.5852\sqrt{n_E}$, where $n_E$ is the number density of conductive edges. This dependence is in agreement with numerical calculations in Voronoi networks, although the effective conductances are approximately 15% larger.