A two-stage solution to quantum process tomography: error analysis and optimal design

Quantum process tomography is a critical task for characterizing the dynamics of quantum systems and achieving precise quantum control. In this paper, we propose a two-stage solution for both trace-preserving and non-trace-preserving quantum process tomography. Utilizing a tensor structure, our algorithm exhibits a computational complexity of $O(ML{d}^2)$ where $d$ is the dimension of the quantum system and $M$, $L$ represent the numbers of different input states and measurement operators, respectively. We establish an analytical error upper bound and then design the optimal input states and the optimal measurement operators, which are both based on minimizing the error upper bound and maximizing the robustness characterized by the condition number. Numerical examples and testing on IBM quantum devices are presented to demonstrate the performance and efficiency of our algorithm.