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Epitaxial Fe film has been grown on ion beam sputtered MgO(001) substrate by electron beam evaporation. Reflection high energy electron diffraction (RHEED) and transport measurements ™ were performed simultaneously during the growth of the film. While TM provided information about film morphology, RHEED provided information about the structure of the film.

生成讲解博客的中文版本

生成AI智能校验的中文版本