A method of estimating the content of crystalline phases in multiphase samples based on X-ray diffraction data

A method for estimating the relative content of crystalline phases of a multiphase sample, based on probabilistic analysis of the intensities of the diffraction pattern reflexes, has been developed. The method is based on the introduction of some numerical parameter, which uniquely characterizes the diffraction pattern, and comparison of the diffraction patterns according to this parameter, using methods of computational statistics. In situations where the absorption coefficients of the phases are close, the method works solely on the analysis of the diffraction pattern data from a specific multiphase sample. It is shown on the control measurements that the uncertainty of the estimates does not exceed $\pm 8$~%.