High resolution up-conversion imaging in the 10 μm band under incoherent illumination

Long-wavelength infrared band exhibits significant utility in thermal signature acquisition and molecular spectral analysis, among other applications. The up-conversion detection technique enables effective signal transduction into the detection bandwidth of silicon-based photodetectors, thereby facilitating high-sensitivity photonic measurements. We realized high-resolution up-conversion imaging for incoherent thermal targets in the 10 μm spectral regime for the first time. Furthermore, this work presents the first derivation of analytical models characterizing depth of field and astigmatic aberration in up-conversion imaging systems, which show excellent agreement between theoretical and experimental results. The results demonstrate generalisability to various up-conversion imaging systems, thus providing critical insights for the design and optimisation of such systems.