Qubit readout schemes often deviate from ideal projective measurements, introducing critical issues that limit quantum computing performance. In this work, we model charge-sensing-based readout for semiconductor spin qubits in double quantum dots, and identify key error mechanisms caused by the back-action of the charge sensor. We quantify how the charge noise of the sensor, residual tunneling, and -tensor modulation degrade readout fidelity, induce a mixed post-measurement state, and cause leakage from the computational subspace. For state-of-the-art systems with strong spin-orbit interaction and electrically tunable -tensors, we identify a readout sweet spot, that is, a special device configuration where readout is closest to projective. Our framework provides a foundation for developing effective readout error mitigation strategies, with broad applications for optimizing readout performance for a variety of charge-sensing techniques, advancing quantum protocols, and improving adaptive circuits for error correction.

生成讲解博客的中文版本

生成AI智能校验的中文版本