Self-diffraction is a non-collinear four-wave mixing technique well-known in optics. We explore self-diffraction in the extreme ultraviolet (EUV) range, taking advantage of intense femtosecond EUV pulses produced by a free electron laser. Two pulses are crossed in a thin cobalt film and their interference results in a spatially periodic electronic excitation. The diffraction of one of the same pulses by the associated refractive index modulation is measured as a function of the EUV wavelength. A sharp peak in the self-diffraction efficiency is observed at the M absorption edge of cobalt at 59 eV and a fine structure is found above the edge. The results are compared with a theoretical model assuming that the excitation results in an increase of the electronic temperature. EUV self-diffraction offers a potentially useful spectroscopy tool and will be instrumental in studying coherent effects in the EUV range.

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