Enhanced magnetic dichroism in darkfield UV photoemission electron microscopy

Photoemission electron microscopy (PEEM) has evolved into an indispensable tool for structural and magnetic characterization of surfaces at the nanometer scale. In strong contrast to synchrotron-radiation-based X-ray PEEM as a leading method for element-specific magnetic properties via magnetic circular dichroism (MCD), laboratory ultraviolet (UV) PEEM has seen limited application with much smaller dichroism effects for in-plane magnetization. Here we introduce darkfield PEEM as a novel approach to enhance MCD contrast in threshold photoemission, enabling efficient MCD imaging with significantly enhanced contrast by an order-of-magnitude for Fe(001). This advancement paves the way for MCD imaging on femtosecond timescales using modern lasers. The experimental results will be quantitatively benchmarked against advanced relativistic photoemission calculations.