Direct determination of the electron-electron mean free path in diffusive mesoscopic samples using shot noise

Using the ‘drift-diffusion-Langevin’ equation, we have recently shown that finite-frequency shot noise in diffusive mesoscopic conductors is very sensitive to the ratio $\gamma \equiv L\mathrm{/}\text{lee}$ between the sample length $L$ and the electron-electron mean free path $\text{lee}$. In this work we present numerical calculations of the noise at arbitrary value of $\gamma$. If coupled with accurate noise measurements, the results presented here could serve as a new and independent way of determining $\text{lee}$ in a given sample.