Dynamic critical behaviors in two-dimensional Josephson junction arrays with positional disorder

We numerically investigate dynamic critical behaviors of two-dimensional (2D) Josephson-junction arrays with positional disorder in the scheme of the resistively shunted junction dynamics. Large-scale computation of the current voltage characteristics reveals an evidence supporting that a phase transition occurs at a nonzero critical temperature in the strong disorder regime, as well as in the weak disorder regime. The phase transition at weak disorder appears to belong to the Berezinskii-Kosterlitz-Thouless (BKT) type. In contrast, evidence for a non-BKT transition is found in the strong disorder regime. These results are consistent with the recent experiment %by Yun {\it et al.} in cond-mat/0509151 on positionally disordered Josephson-junction arrays; in particular, the critical temperature of the non-BKT transition (ranging from 0.265 down to the minimum 0.22 in units of $E_J\mathrm{/}{k}_B$ with the Josephson coupling strength $E_J$), the correlation length critical exponent $\nu =1.2$, and the dynamic critical exponent $z=2.0$ in the strong disorder regime agree with the existing studies of the 2D gauge-glass model.