We propose that the observed low density insulating'' phase of a 2D semiconductor system, with the carrier density being just below ($n < n_c$) the so-called critical density where the derivative of resistivity changes sign at low temperatures (i.e. resistivity $\rho(T)$ increases with increasing $T$ for $n > n_c$ whereas it decreases with increasing $T$ for $n < n_c$), is in fact a high-temperature’’ crossover version of the same effective metallic phase
seen at higher densities (). This low density () finite
temperature crossover 2D effective insulating phase is characterized by
with power law temperature dependence in contrast to the truly
insulating state (occurring at still lower densities) whose resistivity
increases exponentially with decreasing temperature.

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