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Magnetic coupling between Ni_{81}Fe_{19} double thin films separated by an insulating SiO_{2} spacer layer is investigated with structural measurements, cross sectional imaging, magnetization measurements (BH loop) and transport under the conditions of variable spacer thickness ranging from 0 to 5000 Angstroms. We investigate several models to explain the coercivity variation with spacer thickness as well as the transport measurements.

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