This paper studies the striking correlation between nanosized structural patterns in YBCO films and macroscopic transport current. A nanosized network of parallel Josephson junctions laced by insulating dislocations is almost mimicking the grain boundary structural network. It contributes to the macroscopic properties and accounts for the strong intergranular pinning across the film in the intermediate temperature range. The correlation between the two networks enables to find out an outstanding scaling law in the (Jc,B) plane and to determine meaningful parameters concerning the matching between the vortex lattice and the intergranular defect lattice. Two asymptotic behaviors of the pinning force below the flux flow regime are checked: the corresponding vortex phases are clearly individuated.

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