The field of face anti-spoofing (FAS) has witnessed great progress with the
surge of deep learning. Due to its data-driven nature, existing FAS methods are
sensitive to the noise in the dataset, which will hurdle the learning process.
However, very few works consider noise modeling in FAS. In this work, we
attempt to fill this gap by automatically addressing the noise problem from
both label and data perspectives in a probabilistic manner. Specifically, we
propose a unified framework called Dual Probabilistic Modeling (DPM), with two
dedicated modules, DPM-LQ (Label Quality aware learning) and DPM-DQ (Data
Quality aware learning). Both modules are designed based on the assumption that
data and label should form coherent probabilistic distributions. DPM-LQ is able
to produce robust feature representations without overfitting to the
distribution of noisy semantic labels. DPM-DQ can eliminate data noise from
False Reject' and False Accept’ during inference by correcting the prediction
confidence of noisy data based on its quality distribution. Both modules can be
incorporated into existing deep networks seamlessly and efficiently.
Furthermore, we propose the generalized DPM to address the noise problem in
practical usage without the need of semantic annotations. Extensive experiments
demonstrate that this probabilistic modeling can 1) significantly improve the
accuracy, and 2) make the model robust to the noise in real-world datasets.
Without bells and whistles, our proposed DPM achieves state-of-the-art
performance on multiple standard FAS benchmarks.

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