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A potential source of dominant backgrounds for many rare-event searches or screening detectors is from radon daughters, specifically Pb, deposited on detector surfaces, often during detector fabrication. Performing a late-stage etch is challenging because it may damage the detector. This paper describes a late-stage etching technique that reduces surface Pb and Po by at 90% C.L.

生成讲解博客的中文版本

生成AI智能校验的中文版本