In this paper we discuss the reliability of two computational methods (numerical integration on Cartesian grids, and population analysis) used for evaluating scalar quantities related to the nature of electronic transitions. These descriptors are integrals of charge density functions built from the detachment and attachment density matrices projected in the Euclidean space using a finite basis of orbitals. While the numerical integration on Cartesian grids is easily considered to be converged for medium-sized density grids, the population analysis approximation to the numerical integration values is diagnosed using eight diagnostic tests performed on fifty-nine molecules with a combination of fifteen Gaussian basis sets and six exchange-correlation functionals.

生成讲解博客的中文版本

生成AI智能校验的中文版本