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We exploit a recently derived inversion scheme for arbitrary deep neural networks to develop a new semi-supervised learning framework that applies to a wide range of systems and problems. The approach outperforms current state-of-the-art methods on MNIST reaching of test set accuracy while using labeled examples per class. Experiments with one-dimensional signals highlight the generality of the method. Importantly, our approach is simple, efficient, and requires no change in the deep network architecture.

生成讲解博客的中文版本

生成AI智能校验的中文版本