High-precision mass measurements of Cu, Zn, Ga, Ge, As, Br, Rb, and Sr were performed utilizing a multireflection time-of-flight mass spectrograph combined with the gas-filled recoil ion separator GARIS-II. In the case of Ga, a mass uncertainty of 2.1 keV, corresponding to a relative precision of $\delta m / m = 3.5\times10^{-8}$, was obtained and the mass value is in excellent agreement with the 2016 Atomic Mass Evaluation. For Ge and Br, where masses were previously deduced through indirect measurements, discrepancies with literature values were found. The feasibility of using this device for mass measurements of nuclides more neutron-deficient side, which have significant impact on the -process pathway, is discussed.

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