A new technique for infrared scintillation measurements

We propose a new technique to measure the infrared scintillation light yield of rare earth (RE) doped crystals by comparing it to near UV-visible scintillation of a calibrated Pr:(Lu${}_{0.75}$Y${}_{0.25}$)${}_3$Al${}_5$O${}_{12}$ sample. As an example, we apply this technique to provide the light yield in visible and infrared range up to \SI{1700}{nm} of this crystal.