Characterization of YbNi$_4$(P$_{1-{\it x}}$As$_{\it x}$)$_2$, $x = 0, 0.2$ single crystals grown by Czochralski method

We have investigated large single crystals of YbNi $_{4}$ P $_{2}$ that were grown from a levitating melt by the Czochralski method. The new samples facilitate the determination of the absolute values of the electrical resistivity. Phase pure polycrystalline samples of the non-magnetic reference LuNi $_{4}$ P $_{2}$ were prepared and the electrical resistivity was measured. Furthermore we have grown a single crystal of the As substituted compound YbNi $_{4}$ (P${1-{\it x}} $A s$ {\it x} $)$ _2 $,$ x = 0.2$ and investigated the homogenity of the As distribution.

Characterization of YbNi $_{4}$ (P $_{1 - x}$ As $_{x}$ ) $_{2}$ , $x = 0, 0.2$ single crystals grown by Czochralski method

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Characterization of YbNi $_{4}$ (P $_{1 - x}$ As $_{x}$ ) $_{2}$ , $x = 0, 0.2$ single crystals grown by Czochralski method

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Characterization of YbNi44​(P1−x1−x​Asxx​)22​, x=0,0.2x=0,0.2 single crystals grown by Czochralski method

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Characterization of YbNi44​(P1−x1−x​Asxx​)22​, x=0,0.2x=0,0.2 single crystals grown by Czochralski method

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Characterization of YbNi $_{4}$ (P $_{1 - x}$ As $_{x}$ ) $_{2}$ , $x = 0, 0.2$ single crystals grown by Czochralski method

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Characterization of YbNi $_{4}$ (P $_{1 - x}$ As $_{x}$ ) $_{2}$ , $x = 0, 0.2$ single crystals grown by Czochralski method

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