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In this work we present silicon process compatible, stable and reliable (cycles), high non-linearity ratio at half-read voltage ($>5\times 10^{5}<60ns<2V$) back-to-back Schottky diodes. Materials choice of electrode, thickness of semiconductor layer and doping level are investigated by numerical simulation, experiments and current-voltage equations to give a general design consideration when back-to-back Schottky diodes are used as selector device for Resistive Random Access Memory(RRAM) arrays.

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