We present measurements of thermal and electrical spin injection in nanoscale
metallic non-local spin valve (NLSV) structures. Informed by measurements of
the Seebeck coefficient and thermal conductivity of representative films made
using a micromachined Si-N thermal isolation platform, we use simple analytical
and finite element thermal models to determine limits on the thermal gradient
driving thermal spin injection and calculate the spin dependent Seebeck
coefficient to be $-0.5\ \mu/< S_{s}<-1.3
\mu/$. This is comparable in terms of the fraction of the
absolute Seebeck coefficient to previous results, despite dramatically smaller
electrical spin injection signals. Since the small electrical spin signals are
likely caused by interfacial effects, we conclude that thermal spin injection
is less sensitive to the FM/NM interface, and possibly benefits from a layer of
oxidized ferromagnet, which further stimulates interest in thermal spin
injection for applications in sensors and pure spin current sources.

生成讲解博客的中文版本

生成AI智能校验的中文版本