A microscopic mechanism is proposed for a dramatic sign change of the Seebeck coefficient from positive to negative sign by the introduction of antisite defects in FeVAl based on bipolar random Anderson model (BPRAM), which incorporates hybridization effects between randomly distributed antisites and host bands, where the valence and conduction bands are treated separately due to their separation in momentum space. Applying a self-consistent T-matrix approximation, we find that antisite defects in FeVAl induce new states in the band overlap region, resulting in a scattering rate that is higher for hole carriers in the valence band than that for electron carriers in the conduction band, leading to negative Seebeck coefficient. This mechanism of sign change presents a potential new approach for controlling thermoelectric properties in semimetallic systems without changing carrier concentration.

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