Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V${}_2$O${}_3$

We have performed soft-X-ray angle resolved photoemission for metallic V${}_2$O${}_3$. Combining a micro focus beam (40 x 65 $\mu$m${}^2$) and micro positioning techniques with a long working distance microscope, we have succeeded in observing band dispersions from tiny cleavage surfaces with typical size of the several tens of $\mu$m. The photoemission spectra show a clear position dependence reflecting the morphology of the cleaved sample surface. By selecting high quality flat regions on the sample surface, we have succeeded in band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional ARPES for typical three dimensional correlated materials where large cleavage planes are rarely obtained.