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2014-09-02
On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations
Fatima Zahra TaziClaude ThibeaultYvon SavariaSimon PichetteYves Audet
文献摘要
Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported.
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