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We address the problem of comparing and aligning spatial point configurations in arising from structured geometric patterns. Each pattern is decomposed into arms along which we define a normalized finite-difference operator measuring local variations of the height component with respect to the planar geometry of the pattern. This quantity provides a parametrization-independent local descriptor that complements global similarity measures. In particular, it integrates naturally with Wasserstein-type distances for comparing point distributions and with Procrustes analysis for rigid alignment of geometric structures.

生成讲解博客的中文版本

生成AI智能校验的中文版本