Exposed extreme rays of the SONC cone

We provide a complete and explicit characterization of the exposed extreme rays of the cone of sums of nonnegative circuit (SONC) polynomials. The criterion we derive is purely combinatorial and depends only on the existence of certain circuits within the ground set and on the nature of the corresponding extreme ray. Our constructive proofs also yield explicit exposing functionals, offering a basis for algorithmic detection of exposed rays in SONC-based optimization.