Leakage current evolution in LHCb VELO sensors during Run 1-2 LHC data taking period
M. PyciorT. SzumlakA. Oblakowska-MuchaK. AkibaW. BarterS. BorghiT. BowcockE. BuchananJ. BuytaertS. de CapuaS. ChenP. CollinsF. DettoriL. EklundT. EvansM. GersabeckT. GershonT. HadavizadehK. HennessyW. HulsbergenD. HutchcroftM. JohnP. KopciewiczP. KoppenburgT. LathamM. MajewskiC. ParkesA. PoluektovW. QianK. RinnertE. RodriguesM. SchillerM. SmithM. van BeuzekomJ. VelthuisM. Williams
所有作者
M. PyciorT. SzumlakA. Oblakowska-MuchaK. AkibaW. BarterS. BorghiT. BowcockE. BuchananJ. BuytaertS. de CapuaS. ChenP. CollinsF. DettoriL. EklundT. EvansM. GersabeckT. GershonT. HadavizadehK. HennessyW. HulsbergenD. HutchcroftM. JohnP. KopciewiczP. KoppenburgT. LathamM. MajewskiC. ParkesA. PoluektovW. QianK. RinnertE. RodriguesM. SchillerM. SmithM. van BeuzekomJ. VelthuisM. Williams
文献摘要
Silicon detectors operating in the harsh mixed-hadron radiation environment of modern high-energy physics experiments suffer progressive bulk damage, manifesting macroscopically as a steady rise in leakage current.